You are here

Few-Shot Machine Learning of Electron Microscopy

Akers, S., Kautz, E., Trevino-Gavito, A., Olszta, M., Matthews, B., Wang, L., Du, Y., and S.R. Spurgeon. “Rapid and flexible segmentation of electron microscopy data using few-shot machine learning.“ npj Computational Materials. 7 (2021): 187. DOI:10.1038/s41524-021-00652-z
People Involved: 
Research Type: 
Related Fields: