Moiré superlattices in twisted 2D materials have generated tremendous excitement as a platform for achieving quantum properties on demand. Small variations in the moiré pattern can substantially alter a device’s electronic properties , providing a new paradigm in materials design and engineering. However, the moiré pattern is highly sensitive to the interlayer atomic registry, and current assembly techniques suffer from imprecise control of the average twist angle, spatial inhomogeneity in the local twist angle, and distortions caused by random strain. Here we discuss new approaches to measuring and manipulating the moiré patterns in heterostructures fabricated from 2D materials. I review progress towards realizing improved twist-angle homogeneity and reduced random strain in order to realize moiré patterns with precise wavelength and ultralow disorder. Finally I will discuss new approaches that we are pursuing in order to realize yet greater design control by superlattice patterning than may be possible with moire potentials alone.